Panda S K, Sengupta J, Jacob C
Materials Science Centre, Indian Institute of Technology, Kharagpur 721302, India.
J Nanosci Nanotechnol. 2010 May;10(5):3046-52. doi: 10.1166/jnn.2010.2167.
Cubic silicon carbide (beta-SiC)/SiO2 nanowires with uniform and knotted-core structures have been synthesized on nickel-coated Si(111) substrates at 1150 degrees C by using hexamethyldisilane (HMDS) as the source material in a hot wall atmospheric pressure chemical vapor deposition (APCVD) system. The nanowires consist of a single crystalline beta-SiC core wrapped with an amorphous SiO2 shell. The as-prepared SiC nanowires and the deposited Ni films were characterized by field emission scanning electron microscopy, X-ray diffraction, high resolution transmission electron microscopy, energy dispersive X-ray spectroscopy, micro-Raman spectroscopy, infrared spectroscopy and atomic force microscopy. The results show that the nanowires are random in direction and have diameter ranges from 25 nm to 70 nm. The core of the nanowires has a cubic zinc blend structure and a high density of planar defects is often found. The twin plane defects are suspected to be the main reason for the formation of the knotted-core SiC nanowires. A possible growth mechanism based on vapor-liquid-solid (VLS) by base growth technique is proposed.
在热壁大气压化学气相沉积(APCVD)系统中,以六甲基二硅烷(HMDS)为源材料,于1150℃在镀镍的Si(111)衬底上合成了具有均匀且有结芯结构的立方碳化硅(β-SiC)/SiO₂纳米线。这些纳米线由包裹着非晶SiO₂壳层的单晶β-SiC芯组成。通过场发射扫描电子显微镜、X射线衍射、高分辨率透射电子显微镜、能量色散X射线光谱、显微拉曼光谱、红外光谱和原子力显微镜对所制备的SiC纳米线和沉积的Ni膜进行了表征。结果表明,纳米线方向随机,直径范围为25nm至70nm。纳米线的芯具有立方闪锌矿结构,且经常发现高密度的平面缺陷。孪晶面缺陷被认为是形成有结芯SiC纳米线的主要原因。提出了一种基于气-液-固(VLS)的底部生长技术的可能生长机制。