Attolini Giovanni, Rossi Francesca, Bosi Matteo, Watts Bernard Enrico, Salviati Giancarlo
IMEM-CNR Institute, Parco Area delle Scienze 37A, 43124 Parma, Italy.
J Nanosci Nanotechnol. 2011 May;11(5):4109-13. doi: 10.1166/jnn.2011.3864.
beta-SiC nanowires were synthesized on different monocrystalline substrates: Si (001), Si (111), 3C-SiC (001), 4H-SiC (0001), 6H-SiC (0001). The SiC nanowire growth was carried out using a Chemical Vapor Deposition method, with silane and propane diluted in hydrogen (3%) as precursors. The deposition was performed at atmospheric pressure and at 1100 degrees C, after dewetting of the Ni catalyst, which had been previously evaporated onto the substrate, to induce 1D growth according to a VLS process. The crystal structure of the nanowires, as determined by X-ray diffraction and High Resolution Transmission Electron Microscopy, corresponds to 3C-SiC polytype growing along a (111) direction, irrespective of the substrate. The occurrence of (111) stacking faults was observed, partly reduced for samples grown on 3C-SiC substrate. The growth on (111) substrate allowed to achieve a good vertical alignment of the nanowires, as investigated by Scanning Electron Microscopy. High Angle Annular Dark Field imaging and Energy Dispersive X-Ray spectroscopy were performed to study the catalyst particle on top of the wires and showed the formation of a nickel-silicon alloy.
β-SiC纳米线在不同的单晶衬底上合成:Si(001)、Si(111)、3C-SiC(001)、4H-SiC(0001)、6H-SiC(0001)。采用化学气相沉积法生长SiC纳米线,以硅烷和丙烷在氢气(3%)中稀释作为前驱体。在大气压和1100℃下进行沉积,此前已将Ni催化剂蒸发到衬底上,在Ni催化剂去湿后,根据VLS工艺诱导一维生长。通过X射线衍射和高分辨率透射电子显微镜确定,纳米线的晶体结构对应于沿(111)方向生长的3C-SiC多型体,与衬底无关。观察到(111)层错的出现,在3C-SiC衬底上生长的样品中部分减少。通过扫描电子显微镜研究发现,在(111)衬底上生长能够使纳米线实现良好的垂直排列。进行了高角度环形暗场成像和能量色散X射线光谱分析,以研究纳米线顶部的催化剂颗粒,并显示形成了镍硅合金。