Hyung Jung-Hwan, Kim Dong-Joo, Lee Seung-Yong, Lee Sang-Kwon
Department of Semiconductor Science and Technology, Semiconductor Physics Research Center (SPRC), Chonbuk National University, Jeonju 561-756, Korea.
J Nanosci Nanotechnol. 2010 May;10(5):3497-501. doi: 10.1166/jnn.2010.2265.
We report on the effect of surface passivation on the electrical characteristics of multi-channel ZnO nanowire field-effect transistors (FETs). Surface passivation was performed using a SiO2 layer on ZnO nanowires. Multi-channel FETs were prepared by assembling as synthesized ZnO nanowires on a SiO2/Si substrate using an alternating current (AC) dielectrophoresis (DEP) technique. We observed that surface passivation with a SiO2 layer on ZnO nanowires was significantly affected by electrical characteristics of multi-channel ZnO nanowire FETs such as the threshold voltage and transconductance.
我们报道了表面钝化对多通道氧化锌纳米线场效应晶体管(FET)电学特性的影响。使用二氧化硅层对氧化锌纳米线进行表面钝化。通过采用交流电(AC)介电电泳(DEP)技术,将合成的氧化锌纳米线组装在二氧化硅/硅衬底上制备多通道FET。我们观察到,氧化锌纳米线上的二氧化硅层表面钝化对多通道氧化锌纳米线FET的电学特性,如阈值电压和跨导,有显著影响。