同相聚焦调制显微镜的边缘增强

Edge enhancement for in-phase focal modulation microscope.

作者信息

Si Ke, Gong Wei, Chen Nanguang, Sheppard Colin J R

机构信息

Graduate School for Integrative Sciences and Engineering, National University of Singapore, 10 Medical Drive, Singapore 117597, Singapore.

出版信息

Appl Opt. 2009 Nov 10;48(32):6290-5. doi: 10.1364/AO.48.006290.

DOI:10.1364/AO.48.006290

PMID:19904330

Abstract

In-phase focal modulation microscopy (IPFMM) with single photon excited fluorescence is presented. Optical transfer functions and images of thin and thick fluorescent edges in IPFMM are investigated. The results show that, compared with confocal microscopy, using IPFMM can result in a sharper image of the edge, and the edge gradient can be increased up to 75.4% and 58.9% for a thick edge and a thin edge, respectively. Signal level is also discussed, and the results show that, to obtain high transverse resolution with IPFMM, the normalized detector pinhole radius should not exceed 2.8.

摘要

本文介绍了具有单光子激发荧光的同相聚焦调制显微镜（IPFMM）。研究了IPFMM中薄荧光边缘和厚荧光边缘的光学传递函数及图像。结果表明，与共聚焦显微镜相比，使用IPFMM可使边缘图像更清晰，对于厚边缘和薄边缘，边缘梯度分别可提高75.4%和58.9%。还讨论了信号水平，结果表明，为了通过IPFMM获得高横向分辨率，归一化探测器针孔半径不应超过2.8。