Hu Juju, Hu Haijiang, Ji Yinghua
School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai, 200093, China.
Opt Express. 2010 Mar 15;18(6):5831-9. doi: 10.1364/OE.18.005831.
Periodic nonlinearity that ranges from tens of nanometers to a few nanometers in heterodyne interferometer limits its use in high accuracy measurement. A novel method is studied to detect the nonlinearity errors based on the electrical subdivision and the analysis method of statistical signal in heterodyne Michelson interferometer. Under the movement of micropositioning platform with the uniform velocity, the method can detect the nonlinearity errors by using the regression analysis and Jackknife estimation. Based on the analysis of the simulations, the method can estimate the influence of nonlinearity errors and other noises for the dimensions measurement in heterodyne Michelson interferometer.
外差干涉仪中几十纳米到几纳米范围内的周期性非线性限制了其在高精度测量中的应用。研究了一种基于电细分和外差迈克尔逊干涉仪统计信号分析方法来检测非线性误差的新方法。在微定位平台匀速运动的情况下,该方法可通过回归分析和刀切法估计来检测非线性误差。基于仿真分析,该方法能够估计外差迈克尔逊干涉仪中非线性误差及其他噪声对尺寸测量的影响。