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使用定制CMOS调制光相机的宽场外差干涉测量法。

Widefield heterodyne interferometry using a custom CMOS modulated light camera.

作者信息

Patel Rikesh, Achamfuo-Yeboah Samuel, Light Roger, Clark Matt

机构信息

Applied Optics Group, Electrical Systems and Optics Research Division University of Nottingham, University Park, Nottingham, NG7 2RD, UK.

出版信息

Opt Express. 2011 Nov 21;19(24):24546-56. doi: 10.1364/OE.19.024546.

Abstract

In this paper a method of taking widefield heterodyne interferograms using a prototype modulated light camera is described. This custom CMOS modulated light camera (MLC) uses analogue quadrature demodulation at each pixel to output the phase and amplitude of the modulated light as DC voltages. The heterodyne interference fringe patterns are generated using an acousto-optical frequency shifter (AOFS) in an arm of a Mach-Zehnder interferometer. Widefield images of fringe patterns acquired using the prototype MLC are presented. The phase can be measured to an accuracy of ±6.6°. The added value of this method to acquire widefield images are discussed along with the advantages.

摘要

本文描述了一种使用原型调制光相机获取宽场外差干涉图的方法。这种定制的互补金属氧化物半导体(CMOS)调制光相机(MLC)在每个像素处使用模拟正交解调,以直流电压形式输出调制光的相位和幅度。外差干涉条纹图案是利用马赫-曾德尔干涉仪一条臂中的声光频移器(AOFS)产生的。文中展示了使用原型MLC获取的条纹图案的宽场图像。相位测量精度可达±6.6°。本文还讨论了这种获取宽场图像方法的附加值及优势。

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