National Institute of Advanced Industrial Science and Technology, Higashi 1-1-1, Tsukuba Central 5, Tsukuba, Ibaraki 305-8565, Japan.
Chem Commun (Camb). 2010 Jun 28;46(24):4342-4. doi: 10.1039/c0cc00217h. Epub 2010 May 12.
High-resolution scanning electron microscopy (HR-SEM) with backscattered electrons (BSE) under a low accelerating voltage provided images with compositional information about Pt nano-particles with a diameter of approximately 6 nm that were dispersed in mesoporous silica (SBA-15). The dispersion of Pt nano-particles in mesoporous silica was investigated using the BSE imaging method in combination with the broad ion beam (BIB) cross-section fabrication technique.
高分辨率扫描电子显微镜（HR-SEM）结合背散射电子（BSE）在低加速电压下提供了关于直径约为 6nm 的 Pt 纳米粒子在介孔硅（SBA-15）中分散的组成信息的图像。使用 BSE 成像方法结合宽束离子束（BIB）截面制备技术研究了 Pt 纳米粒子在介孔硅中的分散。
