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sigB 缺失降低了单核细胞增生李斯特菌 EGD-e 的耐热性,但不影响其脉冲电场抗性。

sigB absence decreased Listeria monocytogenes EGD-e heat resistance but not its Pulsed Electric Fields resistance.

机构信息

Tecnología de los Alimentos, Universidad de Zaragoza, C/ Miguel Servet 177, 50013 Zaragoza, Spain.

出版信息

Int J Food Microbiol. 2010 Jun 30;141(1-2):32-8. doi: 10.1016/j.ijfoodmicro.2010.04.023. Epub 2010 May 20.

Abstract

This study shows the behaviour of Listeria monocytogenes under heat and Pulsed Electric Fields (PEF) treatments, as well as the influence of sigB in bacterial resistance and recovery. Absence of the sigB gene resulted in a decreased heat tolerance, showing that sigma(B) influences L. monocytogenes heat survival. Heat treatments at 60 degrees C (40s) caused sublethal membrane injuries in 99.99% of survivors. The repair of heat damage required energy production and lipid, protein, and RNA synthesis, and it lasted 6h. Furthermore, deletion of sigB did not affect the heat injuries repair. PEF resistance at pH 4.0 and 7.0 was not influenced by sigB. Sublethal damage after PEF treatments was only detected when PEF-treated cells had previously been heat-shocked (45 degrees C/1h). The membrane repair only required energy production, and it was independent of sigB. Although both heat and PEF treatments have an effect on cellular membrane, the repair of the sublethal damages suggests different membrane targets, and thus we propose a different mechanism of inactivation by these food preservation technologies.

摘要

本研究展示了李斯特菌在热和脉冲电场(PEF)处理下的行为,以及 sigB 基因对细菌抗性和恢复的影响。sigB 基因的缺失导致耐热性降低,表明 sigma(B) 影响李斯特菌的耐热性。60°C(40 秒)的热处理导致 99.99%的存活菌产生亚致死性膜损伤。热损伤的修复需要能量产生和脂质、蛋白质和 RNA 的合成,修复过程持续 6 小时。此外,sigB 的缺失并不影响热损伤的修复。pH 值为 4.0 和 7.0 时,sigB 不影响 PEF 的抗性。只有在先前经过热休克(45°C/1 小时)的 PEF 处理的细胞中,才能检测到 PEF 处理后的亚致死性损伤。膜修复仅需要能量产生,且不依赖于 sigB。尽管热和 PEF 处理都会对细胞膜产生影响,但亚致死性损伤的修复表明存在不同的膜靶标,因此我们提出了这些食品保鲜技术的不同失活动力学机制。

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