This work presents an analysis of the in-plane magnetization reversal mechanisms of Fe nanowires, with widths from 100 nm to 1 microm, fabricated in epitaxial Au(001)/Fe(001)/MgO(001) thin films by means of focused ion and electron beam lithographies, with either positive or negative resist. The experimental results show that the switching mechanisms and hysteresis are almost exclusively functions of the dimensions of the wires and of the Fe intrinsic properties, with minor influence of the specific fabrication route employed upon optimization of nanostructure parameters in terms of crystallinity and morphology, and well defined and reproducible geometry. The reversal processes evolve from wall pinning at low angles between the applied field and the axis of the wires to basically uniform magnetization rotation at high angles. This behaviour can be described in terms of single spin configurations, thus ruling out the formation of multidomain structures even at high angles. The ability to achieve these high quality and well controlled nanowires allowed us to develop an analytical model, based on uniform magnetization configurations considering just the intrinsic Fe properties and the shape and dimensions of the wires. This simple approach provides a very good qualitative and quantitative agreement with the experimental results, thus evidencing the relatively small role of other extrinsic factors in the magnetization processes.