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量化大分子X射线数据集中的仪器误差。

Quantifying instrument errors in macromolecular X-ray data sets.

作者信息

Diederichs Kay

机构信息

University of Konstanz, Faculty of Biology, M647, D-78457 Konstanz, Germany.

出版信息

Acta Crystallogr D Biol Crystallogr. 2010 Jun;66(Pt 6):733-40. doi: 10.1107/S0907444910014836. Epub 2010 May 15.

Abstract

An indicator which is calculated after the data reduction of a test data set may be used to estimate the (systematic) instrument error at a macromolecular X-ray source. The numerical value of the indicator is the highest signal-to-noise [I/sigma(I)] value that the experimental setup can produce and its reciprocal is related to the lower limit of the merging R factor. In the context of this study, the stability of the experimental setup is influenced and characterized by the properties of the X-ray beam, shutter, goniometer, cryostream and detector, and also by the exposure time and spindle speed. Typical values of the indicator are given for data sets from the JCSG archive. Some sources of error are explored with the help of test calculations using SIM_MX [Diederichs (2009), Acta Cryst. D65, 535-542]. One conclusion is that the accuracy of data at low resolution is usually limited by the experimental setup rather than by the crystal. It is also shown that the influence of vibrations and fluctuations may be mitigated by a reduction in spindle speed accompanied by stronger attenuation.

摘要

在对测试数据集进行数据约简后计算得到的一个指标,可用于估计大分子X射线源处的(系统)仪器误差。该指标的数值是实验装置能够产生的最高信噪比[I/σ(I)]值,其倒数与合并R因子的下限相关。在本研究中,实验装置的稳定性受到X射线束、快门、测角仪、低温气流和探测器的特性影响并由其表征,同时也受曝光时间和主轴速度的影响。给出了来自JCSG存档数据集的该指标典型值。借助使用SIM_MX的测试计算[迪德里希斯(2009年),《晶体学报》D65卷,535 - 542页]探索了一些误差来源。一个结论是,低分辨率数据的准确性通常受实验装置限制而非晶体限制。研究还表明,通过降低主轴速度并伴随更强的衰减,可以减轻振动和波动的影响。

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