Lafemina J A, Madjid A H
Appl Opt. 1988 Jun 15;27(12):2621-6. doi: 10.1364/AO.27.002621.
An apparatus is described in which the reflectance and transmittance of a hot sample and a cold sample may be measured simultaneously and differentially in the wavelength region from the infrared to the vacuum ultraviolet. These measurements may be carried out under an ultrahigh vacuum or a gaseous ambience, and the surfaces may be temperature treated (e.g., flashed atomically clean) before the measurement. The hotcold differential capability of the apparatus is convenient when considering the temperature dependence of optical parameters.
描述了一种装置,在该装置中,可以在从红外到真空紫外的波长区域内同时且差分地测量热样品和冷样品的反射率和透射率。这些测量可以在超高真空或气态环境下进行,并且在测量之前可以对表面进行温度处理(例如,原子级闪蒸清洁)。当考虑光学参数的温度依赖性时,该装置的热-冷差分功能很方便。