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漏射辐射轮廓是否与表面等离子体激元的强度轮廓一致?

Does the leakage radiation profile mirror the intensity profile of surface plasmon polaritons?

机构信息

Department of Physics and State Key Laboratory for Mesoscopic Physics, Peking University, Beijing 100871, China.

出版信息

Opt Lett. 2010 Jun 15;35(12):1944-6. doi: 10.1364/OL.35.001944.

Abstract

Although the leakage radiation (LR) image intensity is considered to be in proportion to the surface plasmon polariton (SPP) intensity at the metal-air interface, it has not been proven experimentally, to the best of our knowledge. Here we investigate the relationship between the measured LR intensity profile of SPP interference fringes, which are produced by two SPP launching gratings, and the simulated SPP intensity. The experimental modulation depths agree well with the simulation result of the in-plane electric field component of SPPs, which demonstrates that the image intensity in LR microscopy provides the intensity profile of the in-plane component.

摘要

尽管据我们所知,漏辐射(LR)图像强度被认为与金属-空气界面处的表面等离激元(SPP)强度成正比,但尚未通过实验证明。在这里,我们研究了由两个 SPP 激发光栅产生的 SPP 干涉条纹的测量 LR 强度分布与模拟 SPP 强度之间的关系。实验调制深度与 SPP 的平面内电场分量的模拟结果非常吻合,这表明 LR 显微镜中的图像强度提供了平面内分量的强度分布。

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