Pawluczyk R
Appl Opt. 1990 Feb 1;29(4):589-92. doi: 10.1364/AO.29.000589.
An improved Brewster angle technique for measurement of the refractive index of transparent materials in the form of thick and geometrically nonuniform layers on a much thicker substrate is presented. The technique's usefulness is demonstrated in application to the dichromated gelatin layers.
本文提出了一种改进的布儒斯特角技术,用于测量在厚得多的基底上以厚且几何形状不均匀的层形式存在的透明材料的折射率。该技术在重铬酸盐明胶层中的应用证明了其有效性。