• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利：CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法，用中文像聊天一样搜索，搜遍4000万医学文献。AI智能推荐，让科研检索更轻松。

立即免费搜索

文件翻译

保留排版，准确专业，支持PDF/Word/PPT等文件格式，支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述，25分钟生成高质量综述，智能提取关键信息，辅助科研写作。

立即免费体验

Determination of refractive index and thickness of thick transparent films by variable-angle spectroscopic ellipsometry: application to benzocyclobutene films.

作者信息

Guo S, Gustafsson G, Hagel O J, Arwin H

出版信息

Appl Opt. 1996 Apr 1;35(10):1693-9. doi: 10.1364/AO.35.001693.

DOI:10.1364/AO.35.001693
PMID:21085291
Abstract

An analysis procedure for evaluating the refractive index and the thickness of 5-10-µm-thick transparent films has been developed based on variable-angle spectroscopic ellipsometry. As an example of application, results from an analysis of benzocyclobutene films are presented. The sensitivities in ψ and Δ with respect to the refractive index and the thickness of the films are also discussed.

摘要

相似文献

1
Determination of refractive index and thickness of thick transparent films by variable-angle spectroscopic ellipsometry: application to benzocyclobutene films.
Appl Opt. 1996 Apr 1;35(10):1693-9. doi: 10.1364/AO.35.001693.
2
Optical characterization of low-index transparent thin films on transparent substrates by spectroscopic ellipsometry.
Appl Opt. 1987 Sep 15;26(18):3796-802. doi: 10.1364/AO.26.003796.
3
Estimate of the degree of inhomogeneity of the refractive index of dielectric films from spectroscopic ellipsometry.
Appl Opt. 1992 Oct 1;31(28):6056-61. doi: 10.1364/AO.31.006056.
4
Numerical algorithm for spectroscopic ellipsometry of thick transparent films.厚透明薄膜椭圆偏振光谱法的数值算法
Appl Opt. 1998 Mar 1;37(7):1177-9. doi: 10.1364/ao.37.001177.
5
Optical functions of transparent thin films of SrTiO(3), BaTiO(3), and SiO(x) determined by spectroscopic ellipsometry.用光谱椭偏仪测定的SrTiO(3)、BaTiO(3)和SiO(x)透明薄膜的光学功能。
Appl Opt. 1994 Sep 1;33(25):6053-8. doi: 10.1364/AO.33.006053.
6
Combined reflection and transmission thin-film ellipsometry: a unified linear analysis.反射与透射联合薄膜椭偏测量法：一种统一的线性分析方法
Appl Opt. 1975 Jul 1;14(7):1652-63. doi: 10.1364/AO.14.001652.
7
Method for determination of the parameters of transparent ultrathin films deposited on transparent substrates under conditions of low optical contrast.在低光学对比度条件下测定沉积在透明基板上的透明超薄膜参数的方法。
Appl Opt. 2015 Jul 10;54(20):6208-16. doi: 10.1364/AO.54.006208.
8
Contact angle hysteresis: study by dynamic cycling contact angle measurements and variable angle spectroscopic ellipsometry on polyimide.接触角滞后：通过动态循环接触角测量和可变角度光谱椭偏仪对聚酰亚胺进行的研究。
Langmuir. 2004 Aug 3;20(16):6685-91. doi: 10.1021/la036411l.
9
Measuring the refractive index and thickness of thin transparent films: method.测量透明薄膜的折射率和厚度：方法
Appl Opt. 1974 Jan 1;13(1):122-8. doi: 10.1364/AO.13.000122.
10
Characterization of inhomogeneous transparent thin films on transparent substrates by spectroscopic ellipsometry: refractive indices n(λ) of some fluoride coating materials.用椭圆偏振光谱法表征透明衬底上的非均匀透明薄膜：某些氟化物涂层材料的折射率n(λ)
Appl Opt. 1994 May 1;33(13):2664-71. doi: 10.1364/AO.33.002664.