Girard C, Spajer M
Appl Opt. 1990 Sep 10;29(26):3726-33. doi: 10.1364/AO.29.003726.
We discuss a model that describes the optical interactions between a dielectric tip and a surface exhibiting roughness of subwavelength size (infinite tracks). Such a model gives new insight into the resolution achievable by scanning near field optical microscopy. The dielectric tip is schematized as a cone whose extremity reduces to a small sphere acting as a dipolar scattering center, allowing separation of the contributions from the near field lying at the air-sample interface of other long range terms associated with the progressive waves coming from the surface. It is shown that because of its fast spatial dependence, the near field detected by the tip contains subwavelength features of the object. Relationships with preliminary experiments are discussed.
我们讨论了一个模型，该模型描述了介电尖端与呈现亚波长尺寸粗糙度（无限轨迹）的表面之间的光学相互作用。这样的模型为扫描近场光学显微镜可实现的分辨率提供了新的见解。介电尖端被简化为一个圆锥体，其末端缩小为一个充当偶极散射中心的小球体，从而可以将来自位于空气 - 样品界面的近场贡献与来自表面的行波相关的其他长程项的贡献区分开来。结果表明，由于其快速的空间依赖性，尖端检测到的近场包含物体的亚波长特征。还讨论了与初步实验的关系。
