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最近在用于微波场微损探测的电光传感器设计方面的进展。

Recent advances in the design of electro-optic sensors for minimally destructive microwave field probing.

机构信息

Division of Physical Metrology, Korea Research Institute of Standards and Science, Yuseong-gu, Daejeon 305-340, Korea.

出版信息

Sensors (Basel). 2011;11(1):806-24. doi: 10.3390/s110100806. Epub 2011 Jan 12.

Abstract

In this paper we review recent design methodologies for fully dielectric electro-optic sensors that have applications in non-destructive evaluation (NDE) of devices and materials that radiate, guide, or otherwise may be impacted by microwave fields. In many practical NDE situations, fiber-coupled-sensor configurations are preferred due to their advantages over free-space bulk sensors in terms of optical alignment, spatial resolution, and especially, a low degree of field invasiveness. We propose and review five distinct types of fiber-coupled electro-optic sensor probes. The design guidelines for each probe type and their performances in absolute electric-field measurements are compared and summarized.

摘要

在本文中,我们回顾了最近用于全介电电光传感器的设计方法,这些传感器在对辐射、引导或可能受到微波场影响的器件和材料进行无损评估 (NDE) 方面有应用。在许多实际的 NDE 情况下,由于光纤耦合传感器在光学对准、空间分辨率以及特别是低场入侵程度方面优于自由空间块状传感器,因此光纤耦合传感器配置更受欢迎。我们提出并回顾了五种不同类型的光纤耦合电光传感器探头。比较并总结了每种探头类型的设计指南及其在绝对电场测量中的性能。

https://cdn.ncbi.nlm.nih.gov/pmc/blobs/caa1/3274120/e4208b6120fd/sensors-11-00806f1.jpg

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