• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

利用相移干涉仪从空间移位图中差分得到绝对表面计量学。

Absolute surface metrology by differencing spatially shifted maps from a phase-shifting interferometer.

机构信息

Jet Propulsion Laboratory, California Institute of Technology, Pasadena, California 91109, USA.

出版信息

Opt Lett. 2010 Jul 15;35(14):2346-8. doi: 10.1364/OL.35.002346.

DOI:10.1364/OL.35.002346
PMID:20634825
Abstract

Surface measurements of precision optics are commonly made with commercially available phase-shifting Fizeau interferometers that provide data relative to flat or spherical reference surfaces whose unknown errors are comparable to those of the surface being tested. A number of ingenious techniques provide surface measurements that are "absolute," rather than relative to any reference surface. Generally, these techniques require numerous measurements and the introduction of additional surfaces, but still yield absolute information only along certain lines over the surface of interest. A very simple alternative is presented here, in which no additional optics are required beyond the surface under test and the transmission flat (or sphere) defining the interferometric reference surface. The optic under test is measured in three positions, two of which have small lateral shifts along orthogonal directions, nominally comparable to the transverse spatial resolution of the interferometer. The phase structure in the reference surface then cancels out when these measurements are subtracted in pairs, providing a grid of absolute surface height differences between neighboring resolution elements of the surface under test. The full absolute surface, apart from overall phase and tip/tilt, is then recovered by standard wavefront reconstruction techniques.

摘要

精密光学元件的表面测量通常使用市售的相移菲索(Fizeau)干涉仪进行,这些干涉仪提供的数据相对于平面或球面参考表面,而参考表面的未知误差与被测试表面相当。许多巧妙的技术提供了“绝对”的表面测量,而不是相对于任何参考表面。通常,这些技术需要多次测量并引入额外的表面,但仍然只能在感兴趣的表面上的某些线上提供绝对信息。这里提出了一种非常简单的替代方法,其中除了被测表面和定义干涉参考表面的透射平面(或球体)之外,不需要额外的光学元件。被测光学元件在三个位置进行测量,其中两个位置在正交方向上有小的横向偏移,名义上与干涉仪的横向空间分辨率相当。当这些测量值成对相减时,参考表面中的相位结构会相互抵消,从而在被测表面的相邻分辨率单元之间提供了一个网格状的绝对表面高度差。然后,通过标准的波前重建技术,可以恢复除整体相位和俯仰/偏摆之外的完整绝对表面。

相似文献

1
Absolute surface metrology by differencing spatially shifted maps from a phase-shifting interferometer.利用相移干涉仪从空间移位图中差分得到绝对表面计量学。
Opt Lett. 2010 Jul 15;35(14):2346-8. doi: 10.1364/OL.35.002346.
2
Absolute surface metrology with a phase-shifting interferometer for incommensurate transverse spatial shifts.用于非 commensurate 横向空间位移的相移干涉仪绝对表面计量学。 注:“incommensurate”这个词不太常见,可能是专业领域里的特定术语,在一般语境下不太好准确翻译,这里直接保留英文,你可以根据具体专业背景进一步理解其准确含义后再进行调整。
Appl Opt. 2014 Feb 10;53(5):792-7. doi: 10.1364/AO.53.000792.
3
Absolute spherical surface metrology by differencing rotation maps.
Appl Opt. 2015 Jul 10;54(20):6186-9. doi: 10.1364/AO.54.006186.
4
A "virtual-interferometer" technique for surface metrology.
Opt Express. 2010 Apr 26;18(9):8772-80. doi: 10.1364/OE.18.008772.
5
An absolute test for axicon surfaces.轴棱锥表面的绝对检验。
Opt Lett. 2011 Jun 1;36(11):2005-7. doi: 10.1364/OL.36.002005.
6
Absolute measurement of optical flat surface shape based on the conjugate differential method.
Opt Express. 2015 Nov 16;23(23):29687-97. doi: 10.1364/OE.23.029687.
7
Testing spherical surfaces: a fast, quasi-absolute technique.
Appl Opt. 1992 Aug 1;31(22):4350-4. doi: 10.1364/AO.31.004350.
8
Iterative full-bandwidth wavefront reconstruction from a set of low-tilt Fizeau interferograms for high-numerical-aperture surface characterization.基于一组低倾斜斐索干涉图的迭代全带宽波前重建用于高数值孔径表面表征。
Appl Opt. 2006 Jun 20;45(18):4270-83. doi: 10.1364/ao.45.004270.
9
Self-Calibration of a Large-Scale Variable-Line-Spacing Grating for an Absolute Optical Encoder by Differencing Spatially Shifted Phase Maps from a Fizeau Interferometer.利用 Fizeau 干涉仪从空间移位的相位图中差分,实现大型变线距光栅绝对光学编码器的自校准。
Sensors (Basel). 2022 Dec 1;22(23):9348. doi: 10.3390/s22239348.
10
Interferometric measurement of near-cylindrical surfaces with high amplitude resolution.具有高幅度分辨率的近圆柱面干涉测量
Appl Opt. 1995 Nov 1;34(31):7207-12. doi: 10.1364/AO.34.007207.

引用本文的文献

1
Self-Calibration of a Large-Scale Variable-Line-Spacing Grating for an Absolute Optical Encoder by Differencing Spatially Shifted Phase Maps from a Fizeau Interferometer.利用 Fizeau 干涉仪从空间移位的相位图中差分,实现大型变线距光栅绝对光学编码器的自校准。
Sensors (Basel). 2022 Dec 1;22(23):9348. doi: 10.3390/s22239348.