Physikalisches Institut, Westfälische Wilhelms-Universität Münster, Münster, Germany.
Nanotechnology. 2010 Aug 27;21(34):345703. doi: 10.1088/0957-4484/21/34/345703. Epub 2010 Aug 4.
The dissipative tip-sample interactions are measured by dynamic force spectroscopy for silicon tips on NaCl(001) in ultrahigh vacuum in the attractive and repulsive force regimes. Force and dissipation versus distance curves were obtained for different sample temperatures ranging from 35 to 285 K. Detailed comparison in different distance regimes shows that neither the force nor energy dissipation exhibits a systematic variation with sample temperature.
耗散尖端-样品相互作用通过在真空中对硅针尖在 NaCl(001)上的吸引和排斥力区域进行动态力谱测量来测量。对于不同的样品温度（范围为 35 至 285 K），获得了不同的力和耗散与距离曲线。在不同的距离区域的详细比较表明，力和能量耗散都没有与样品温度表现出系统的变化。
