Division of Neurobiology, Ludwig-Maximilians-Universität München, Planegg-Martinsried, Germany.
J Neurosci Methods. 2010 Oct 15;192(2):286-95. doi: 10.1016/j.jneumeth.2010.08.006. Epub 2010 Aug 10.
Scanning photostimulation is a well-established method for studying the functional microcircuitry in brain slices. Light-evoked responses are thereby taken as an indicator for a connected presynaptic partner. Such an approach thus requires a clear distinction between the photo-evoked and the spontaneous responses. Here we show that, for a data set from entorhinal cortex layer II with high spontaneous synaptic rates of up to 10Hz, it is possible to identify presynaptic sites. The underlying detection algorithm is based on the finding that a presynaptic cell has several neighboring activation sites, resulting in the clustered appearance of specific photo-evoked inputs. The main idea behind this approach is to identify "hit" locations at which the number of intracellularly recorded synaptic events is significantly larger as expected from the hypothesis of statistical independence. The algorithm works without making use of EPSC amplitude information and for single trials, i.e., each site is stimulated only once. The hit maps are tested upon reliability by repeated stimulations and by blocking synaptically mediated responses via TTX. Furthermore, based on the hit density of surrogate data, we devise a Bayesian formalism to estimate the number of presynaptic partners. In these simulations we find good agreement between estimated and real number of input cells, which shows that the hit density can be used as a reliable measure for afferent connectivity.
扫描光刺激是研究脑片内功能微电路的一种成熟方法。光诱发反应因此被用作连接的突触前伙伴的指标。因此,这种方法需要清楚地区分光诱发和自发反应。在这里,我们展示了对于一个自发突触率高达 10Hz 的内嗅皮层 II 层的数据集,有可能识别突触前位点。基础的检测算法基于以下发现:一个突触前细胞有几个邻近的激活位点,导致特定光诱发输入的聚类出现。这种方法的主要思想是识别“命中”位置,即细胞内记录的突触事件数量明显大于统计独立假设所预期的数量。该算法无需使用 EPSC 幅度信息,也无需对单个试验进行处理,即每个位点仅刺激一次。通过重复刺激和通过 TTX 阻断突触介导的反应来测试命中图的可靠性。此外,基于替代数据的命中密度,我们设计了一种贝叶斯形式主义来估计突触前伙伴的数量。在这些模拟中,我们发现估计和实际输入细胞数量之间有很好的一致性,这表明命中密度可以作为传入连接性的可靠度量。