• 文献检索
  • 文档翻译
  • 深度研究
  • 学术资讯
  • Suppr Zotero 插件Zotero 插件
  • 邀请有礼
  • 套餐&价格
  • 历史记录
应用&插件
Suppr Zotero 插件Zotero 插件浏览器插件Mac 客户端Windows 客户端微信小程序
定价
高级版会员购买积分包购买API积分包
服务
文献检索文档翻译深度研究API 文档MCP 服务
关于我们
关于 Suppr公司介绍联系我们用户协议隐私条款
关注我们

Suppr 超能文献

核心技术专利:CN118964589B侵权必究
粤ICP备2023148730 号-1Suppr @ 2026

文献检索

告别复杂PubMed语法,用中文像聊天一样搜索,搜遍4000万医学文献。AI智能推荐,让科研检索更轻松。

立即免费搜索

文件翻译

保留排版,准确专业,支持PDF/Word/PPT等文件格式,支持 12+语言互译。

免费翻译文档

深度研究

AI帮你快速写综述,25分钟生成高质量综述,智能提取关键信息,辅助科研写作。

立即免费体验

具有高质量波前的激光源的设计与评估。

Design and evaluation of laser sources with high-quality wave fronts.

作者信息

Cochran E R

出版信息

Appl Opt. 1991 Dec 1;30(34):5037-48. doi: 10.1364/AO.30.005037.

DOI:10.1364/AO.30.005037
PMID:20717318
Abstract

The design and evaluation of laser sources that have high-quality wave fronts with minimal residual aberrations and irregularities are described. Two such sources have been developed-a collimated reference source and a point reference source. The collimated reference source provides a collimated wave front with a wave-front irregularity of <0.01 wave rms over a 6-mm clear aperture. Collimation is better than 0.067 wave peak to valley, with an angular ray departure of <1.75 x 10(-5) rad. The point reference source provides a diverging wave front with a wave-front irregularity of <0.01 wave rms over a 0.60 numerical aperture and 0.005 wave rms over a 0.35 numerical aperture. Source wavelengths are 670, 780, and 820 nm. These laser sources may be characterized in terms of their fourth-order wave-front polynomial coefficients by using the testing methods developed in this paper. Once characterized, the sources are used as a known input for testing the optical response of unknown systems. This enables complete characterization of an unknown system in terms of aberration polynomials or other criteria of interest when used in conjunction with a wave-front sensing interferometer. These sources are used to evaluate an equal-path, phase-modulated Mach-Zehnder interferometer. Applications include general-purpose laboratory sources as well as tools for evaluating the accuracy of optical systems.

摘要

本文描述了具有高质量波前、最小残余像差和不规则性的激光源的设计与评估。已开发出两种这样的源——一种准直参考源和一种点参考源。准直参考源在6毫米的清晰孔径上提供波前不规则性小于0.01波均方根值(rms)的准直波前。准直度优于0.067波峰谷值,角光线偏差小于1.75×10⁻⁵弧度。点参考源在数值孔径为0.60时提供波前不规则性小于0.01波rms的发散波前,在数值孔径为0.35时提供波前不规则性为0.005波rms的发散波前。源波长为670、780和820纳米。通过使用本文开发的测试方法,可以根据其第四阶波前多项式系数来表征这些激光源。一旦表征完成,这些源就用作测试未知系统光学响应的已知输入。当与波前传感干涉仪结合使用时,这能够根据像差多项式或其他感兴趣的标准对未知系统进行完整表征。这些源用于评估等光程、相位调制马赫 - 曾德尔干涉仪。其应用包括通用实验室光源以及评估光学系统精度的工具。

相似文献

1
Design and evaluation of laser sources with high-quality wave fronts.具有高质量波前的激光源的设计与评估。
Appl Opt. 1991 Dec 1;30(34):5037-48. doi: 10.1364/AO.30.005037.
2
A source of a reference spherical wave based on a single mode optical fiber with a narrowed exit aperture.
Rev Sci Instrum. 2008 Mar;79(3):033107. doi: 10.1063/1.2900561.
3
Sensing refractive-turbulence profiles (C(n)(2)) using wave front phase measurements from multiple reference sources.
Appl Opt. 1992 Dec 1;31(34):7283-91. doi: 10.1364/AO.31.007283.
4
Fabrication of extreme-ultraviolet point-diffraction interferometer aperture arrays.极紫外点衍射干涉仪孔径阵列的制造
Appl Opt. 1995 Oct 1;34(28):6393-8. doi: 10.1364/AO.34.006393.
5
Pupil exploration and wave-front-polynomial fitting of optical systems.
Appl Opt. 1995 Dec 1;34(34):7986-97. doi: 10.1364/AO.34.007986.
6
Wave-front measurement errors from restricted concentric subdomains.
J Opt Soc Am A Opt Image Sci Vis. 2001 Sep;18(9):2146-52. doi: 10.1364/josaa.18.002146.
7
Coating-induced wave-front aberrations: on-axis astigmatism and chromatic aberration in all-reflecting systems.涂层引起的波前像差:全反射系统中的轴向像散和色差。
Appl Opt. 1994 Apr 1;33(10):2002-12. doi: 10.1364/AO.33.002002.
8
Grazing incidence interferometry: the use of the Linnik interferometer for testing image-forming reflection systems.掠入射干涉测量法:使用林尼克干涉仪测试成像反射系统。
Appl Opt. 1979 Jun 15;18(12):2003-12. doi: 10.1364/AO.18.002003.
9
Measurement and analysis of diode laser wave fronts.二极管激光波前的测量与分析。
Appl Opt. 1981 Oct 15;20(20):3520-5. doi: 10.1364/AO.20.003520.
10
Adaptive wave-front correction by means of all-optical feedback interferometry.通过全光反馈干涉测量法进行自适应波前校正。
Opt Lett. 2000 Jun 1;25(11):773-5. doi: 10.1364/ol.25.000773.