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刚性基底上聚合物薄膜的力学性能。

Mechanical properties of thin polymer films on stiff substrates.

作者信息

Silbernagl Dorothee, Cappella Brunero

机构信息

Federal Institute for Material Research and Testing (BAM), Berlin, Germany.

出版信息

Scanning. 2010 Sep-Oct;32(5):282-93. doi: 10.1002/sca.20196. Epub 2010 Aug 17.

Abstract

Force-displacement curves have been acquired with a commercial atomic force microscope on thin films of poly(n-butyl methacrylate) on glass substrates in order to examine the so-called "mechanical double layer" topic, i.e. the influence of the substrate on the mechanical properties of the film in dependence of the film thickness. The hyperbolic fit, a novel semi-empirical equation introduced in previous articles, has been further corroborated. The interpretation of this equation has been deepened, yielding a quantitative and demonstrative characterization of the mechanical properties of double layers. Provided that the Young's moduli of bulk polymer and substrate are measured from the deformation curves, this mathematical model permits to fit the deformation-force curves on the double layers and to determine the thickness of the polymer films in wide range (0-200  nm).

摘要

使用商用原子力显微镜获取了玻璃基板上聚(甲基丙烯酸正丁酯)薄膜的力-位移曲线,以研究所谓的“机械双层”主题,即基板对薄膜机械性能的影响与薄膜厚度的关系。先前文章中引入的一种新的半经验方程——双曲线拟合,得到了进一步证实。该方程的解释得到了深化,从而对双层的机械性能进行了定量和示范性表征。只要从变形曲线测量本体聚合物和基板的杨氏模量,这个数学模型就可以拟合双层上的变形-力曲线,并在很宽的范围内(0-200纳米)确定聚合物薄膜的厚度。

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