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使用微通道板进行X射线聚焦。

X-ray focusing using microchannel plates.

作者信息

Kaaret P, Geissbühler P, Chen A, Glavinas E

出版信息

Appl Opt. 1992 Dec 1;31(34):7339-43. doi: 10.1364/AO.31.007339.

Abstract

We present measurements of the x-ray focusing properties of square-pore microchannel plates (MCP's). Square-pore MCP's contain large numbers of closely packed optical surfaces, as required for grazing incidence x-ray optics. The surface of individual MCP channels has been measured and found to have high microroughness transverse to the channel axis and low microroughness parallel to the axis. The high frequency transverse roughness, on length scales greater than 400 nm, has a rms value of 5.9 nm and a Gaussian autocorrelation function with correlation length of 1.41 microm. We find that the geometric misalignments of the surfaces of different channels limit the angular resolution obtainable with current samples of MCP's to 7.1 arcmin.

摘要

我们展示了方孔微通道板(MCP)的X射线聚焦特性测量结果。方孔MCP包含大量紧密排列的光学表面,这是掠入射X射线光学所需的。已对单个MCP通道的表面进行了测量,发现其横向于通道轴具有高微观粗糙度,而平行于轴具有低微观粗糙度。在大于400nm的长度尺度上,高频横向粗糙度的均方根值为5.9nm,具有相关长度为1.41微米的高斯自相关函数。我们发现,不同通道表面的几何失调将当前MCP样品可获得的角分辨率限制为7.1角分。

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