Chenault D B, Chipman R A
Appl Opt. 1993 Jul 1;32(19):3513-9. doi: 10.1364/AO.32.003513.
A technique to measure linear diattenuation and retardance spectra of infrared materials in transmission is described. A sample is rotated between two stationary linear polarizers in the sample compartment of a Fourier transform infrared spectrometer. The intensity modulation that results from the rotation of the sample is Fourier analyzed, and the linear diattenuation and linear retardance of the sample are calculated from the Fourier series coefficients for each wavelength. The advantages of this technique include immunity of the measurement to instrumental polarization, to circular diattenuation, and to circular retardance. The rotating sample polarimeter does not require retarders. Compensation for systematic errors from polarizers with diattenuation less than one is included in the data reduction. This technique is useful for the calibration of retarders and polarizers and hence for the bootstrap calibration of more elaborate polarimeters such as Mueller matrix polarimeters. We present as an example of t technique the caliration spectra 3-14 µm of an infrared quasi-achromatic retarder whose fast axis orientation oscillates with wavelength.
描述了一种在透射模式下测量红外材料线性衰减和延迟光谱的技术。在傅里叶变换红外光谱仪的样品池中,一个样品在两个固定的线性偏振器之间旋转。对样品旋转产生的强度调制进行傅里叶分析,并根据每个波长的傅里叶级数系数计算样品的线性衰减和线性延迟。该技术的优点包括测量不受仪器偏振、圆二向色性和圆延迟的影响。旋转样品偏振仪不需要延迟器。在数据处理中包括了对衰减小于1的偏振器系统误差的补偿。该技术对于延迟器和偏振器的校准很有用,因此对于更精密的偏振仪(如穆勒矩阵偏振仪)的自举校准也很有用。作为该技术的一个例子,我们给出了一个红外准消色差延迟器在3-14 µm的校准光谱,其快轴方向随波长振荡。