Nakagawa K, Yoshimura T, Minemoto T
Appl Opt. 1993 Sep 1;32(25):4898-903. doi: 10.1364/AO.32.004898.
The statistical properties of the doubly scattered speckle pattern generated from a rough surface, under a fully developed and static speckle pattern illumination, have been investigated by numerical analysis. The real-time Fourier transformation of the doubly scattered speckle pattern by an optical process enables us to measure the surface roughness in quasi real time.
