Chong Wee Keat, Li Xiang, Wijesoma Sardha
Precision Measurement Group, Singapore Institute of Manufacturing Technology, 71 Nanyang Drive, Singapore 638075, Singapore.
Appl Opt. 2010 Sep 10;49(26):4990-4. doi: 10.1364/AO.49.004990.
This paper presents a computationally efficient model to simulate the interference signal of vertical scanning interferometry. Existing models are either oversimplified or computationally intensive. Our model incorporates the geometric and spectral effects on vertical scanning interferometry, but removes the computationally intensive numerical integration process by modeling the light spectrum as a sum of piecewise cosine functions. Compared to direct numerical integration of the generalized model, the computational time (for an interference signal) of the proposed model is 256,800 times faster. To verify the accuracy of the proposed model, we simulate the interference signal of a phosphor-based LED, and verify our result with experimental data and a computationally intensive counterpart. Other than reduced computational time, the elementary form of an interference signal derived in this paper will facilitate future work.
本文提出了一种计算效率高的模型来模拟垂直扫描干涉测量的干涉信号。现有的模型要么过于简化，要么计算量很大。我们的模型纳入了垂直扫描干涉测量中的几何和光谱效应，但通过将光谱建模为分段余弦函数的和，省去了计算量很大的数值积分过程。与广义模型的直接数值积分相比，所提模型（用于干涉信号）的计算时间快256,800倍。为验证所提模型的准确性，我们模拟了基于荧光粉的发光二极管的干涉信号，并用实验数据和一个计算量很大的对应模型来验证我们的结果。除了减少计算时间外，本文推导的干涉信号的基本形式将有助于未来的工作。
