Huitink David, Gao Feng, Liang Hong
Department of Mechanical Engineering, Texas A&M University, College Station, Texas, USA.
Scanning. 2010 Sep-Oct;32(5):336-44. doi: 10.1002/sca.20197. Epub 2010 Sep 17.
A scanning-probe-based technique to observe tribo-electrochemically stimulated surface was demonstrated. The configuration consists of an electrochemical cell attached to an atomic force microscope (AFM) scanner. Under an applied electrical potential and in various chemical environments, the surface morphology, roughness, skew, bearing ratio, as well as surface adhesive forces between probes were measured, and the effects of mechano-electrochemical stimuli were evaluated. The effects of mechanical, electrochemical, and mechano-electrochemical stimuli were found to compete during AFM sliding process. Their effects do not follow a linear relationship, implying that the mechanical stimulus promotes electrochemical reactions. Similarly, electrochemically enhanced mechanical removal of surface materials is possible.
展示了一种基于扫描探针的技术来观察摩擦电化学刺激表面。该配置由连接到原子力显微镜（AFM）扫描仪的电化学池组成。在施加电势和各种化学环境下，测量了表面形貌、粗糙度、偏斜度、承载比以及探针之间的表面粘附力，并评估了机械电化学刺激的效果。发现在AFM滑动过程中，机械、电化学和机械电化学刺激的效果相互竞争。它们的效果不呈线性关系，这意味着机械刺激促进了电化学反应。同样，通过电化学增强机械去除表面材料也是可能的。
