Institute of Condensed Matter and Nanosciences–Bio and Soft Matter (IMCN/BSMA), Université catholique de Louvain, Louvain-la-Neuve, Belgium.
J Am Soc Mass Spectrom. 2010 Dec;21(12):2005-10. doi: 10.1016/j.jasms.2010.08.013. Epub 2010 Aug 27.
The enhancement of the static secondary ion mass spectrometry (SIMS) signals resulting from the injection, closely to the sample surface, of H(2)O vapor at relatively high-pressure, was investigated for a set of organic materials. While the ion signals are generally improved with increasing H(2)O pressure upon 12 keV Ga(+) bombardment, a specific enhancement of the protonated ion intensity is clearly demonstrated in each case. For instance, the presence of H(2)O vapor induces an enhancement by one order of magnitude of the M + H static SIMS intensity for the antioxidant Irgafos 168 and a ∼1.5-fold increase for polymers such as poly(vinyl pyrrolidone).
研究了在相对高压下将 H(2)O 蒸汽注入到样品表面附近对一组有机材料的静态二次离子质谱 (SIMS) 信号的增强作用。虽然在 12keV Ga(+) 轰击时,随着 H(2)O 压力的增加,离子信号通常会增强,但在每种情况下都清楚地证明了质子化离子强度的特定增强。例如,H(2)O 蒸汽的存在会使抗氧化剂 Irgafos 168 的M+H静态 SIMS 强度增强一个数量级,而对于聚合物如聚乙烯吡咯烷酮则会增加约 1.5 倍。