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最小方差超声成象应用于原位稀疏导波阵列。

Minimum variance ultrasonic imaging applied to an in situ sparse guided wave array.

机构信息

School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA, USA.

出版信息

IEEE Trans Ultrason Ferroelectr Freq Control. 2010 Oct;57(10):2311-23. doi: 10.1109/TUFFC.2010.1692.

Abstract

Ultrasonic guided wave imaging with a sparse, or spatially distributed, array can detect and localize damage over large areas. Conventional delay-and-sum images from such an array typically have a relatively high noise floor, however, and contain artifacts that often cannot be discriminated from damage. Considered here is minimum variance distortionless response (MVDR) imaging, which is a variation of delay-and-sum imaging whereby weighting coefficients are adaptively computed at each pixel location. Utilization of MVDR significantly improves image quality compared with delay-and-sum imaging, and additional improvements are obtained from incorporation of a priori scattering information in the MVDR method, use of phase information, and instantaneous windowing. Simulated data from a through-hole scatterer are used to illustrate performance improvements, and a performance metric is proposed that allows for quantitative comparisons of images from a known scatterer. Experimental results from a through-hole scatterer are also provided that illustrate imaging efficacy.

摘要

稀疏或空间分布阵列的超声导波成像是可以检测和定位大面积损伤的。然而,这种阵列的常规延迟和求和图像通常具有相对较高的噪声底,并且包含的伪影通常无法与损伤区分开来。这里考虑的是最小方差无失真响应(MVDR)成像,这是延迟和求和成像的一种变体,其中在每个像素位置自适应地计算加权系数。与延迟和求和成像相比,MVDR 的使用显著提高了图像质量,并且通过在 MVDR 方法中结合先验散射信息、使用相位信息和瞬时窗口化,还可以获得额外的改进。从通孔散射体获得的模拟数据用于说明性能改进,并且提出了一种性能指标,允许对来自已知散射体的图像进行定量比较。还提供了通孔散射体的实验结果,说明了成像效果。

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