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干涉图的相位统计及其在合成孔径雷达中的应用

Phase statistics of interferograms with applications to synthetic aperture radar.

作者信息

Just D, Bamler R

出版信息

Appl Opt. 1994 Jul 10;33(20):4361-8. doi: 10.1364/AO.33.004361.

Abstract

Interferometric methods are well established in optics and radio astronomy. In recent years, interferometric concepts have been applied successfully to synthetic aperture radar (SAR) and have opened up new possibilities in the area of earth remote sensing. However interferometric SAR applications require thorough phase control through the imaging process. The phase accuracy of SAR images is affected by decorrelation effects between the individual surveys. We analyze quantitatively the influence of decorrelation on the phase statistics of SAR interferograms. In particular, phase aberrations as they occur in typical SAR processors are studied in detail. The dependence of the resulting phase bias and variance on processor parameters is presented in several diagrams.

摘要

干涉测量方法在光学和射电天文学中已得到广泛应用。近年来,干涉测量概念已成功应用于合成孔径雷达(SAR),并为地球遥感领域开辟了新的可能性。然而,干涉SAR应用需要在成像过程中进行全面的相位控制。SAR图像的相位精度受各次测量之间去相关效应的影响。我们定量分析了去相关对SAR干涉图相位统计的影响。特别是,详细研究了典型SAR处理器中出现的相位像差。所得相位偏差和方差对处理器参数的依赖性在几个图表中给出。

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