Zabler S, Rack T, Rack A, Nelson K
Institute for Materials Science, Technical University of Berlin, EB 13, Strasse des 17, Juni 135, D-10623 Berlin, Germany.
Rev Sci Instrum. 2010 Oct;81(10):103703. doi: 10.1063/1.3495966.
Quantitative investigation of micrometer and submicrometer gaps between joining metal surfaces is applied to conical plug-socket connections in dental titanium implants. Microgaps of widths well beyond the resolving power of industrial x-ray systems are imaged by synchrotron phase contrast radiography. Furthermore, by using an analytical model for the relatively simple sample geometry and applying it to numerical forward simulations of the optical Fresnel propagation, we show that quantitative measurements of the microgap width down to 0.1 μm are possible. Image data recorded at the BAMline (BESSY-II light source, Germany) are presented, with the resolving power of the imaging system being 4 μm in absorption mode and ∼14 μm in phase contrast mode (z(2)=0.74 m). Thus, phase contrast radiography, combined with numerical forward simulations, is capable of measuring the widths of gaps that are two orders of magnitude thinner than the conventional detection limit.
对牙科钛植入物中锥形插头 - 插座连接的金属连接表面之间的微米级和亚微米级间隙进行定量研究。宽度远超工业X射线系统分辨能力的微间隙通过同步辐射相衬射线成像进行成像。此外，通过针对相对简单的样品几何形状使用分析模型并将其应用于光学菲涅耳传播的数值正向模拟，我们表明可以对低至0.1μm的微间隙宽度进行定量测量。展示了在BAMline（德国BESSY-II光源）记录的图像数据，成像系统在吸收模式下的分辨能力为4μm，在相衬模式下约为14μm（z(2)=0.74m）。因此，相衬射线成像与数值正向模拟相结合，能够测量比传统检测极限薄两个数量级的间隙宽度。
