Nomura T, Kamiya K, Miyashiro H, Yoshikawa K, Tashiro H
Appl Opt. 1995 May 1;34(13):2187-93. doi: 10.1364/AO.34.002187.
When a zone-plate interferometer is used, a bright spot appears at the center of the image plane. The spot makes it difficult to analyze the interference fringes. A simple technique that is based on the principle of fringe-intensity reversal is proposed to analyze the fringes efficiently. A zone plate with a phase fraction of π/2 or 3π/2 is used in this technique to diminish the bright spot. Unlike the masking technique, no part of the data on the fringes is lost. The fringes can, therefore, be analyzed completely. The technique is described in detail, and the results of an experiment in which the shape error of a concave mirror was measured with the proposed zone plate is presented. The experimental results agree well with the results obtained with the Fizeau interferometer.
当使用波带片干涉仪时，在像平面的中心会出现一个亮点。这个亮点使得干涉条纹的分析变得困难。提出了一种基于条纹强度反转原理的简单技术，以有效地分析条纹。在该技术中，使用相位分数为π/2或3π/2的波带片来减弱亮点。与掩膜技术不同，条纹上的数据没有任何部分丢失。因此，可以对条纹进行完整的分析。详细描述了该技术，并给出了一个实验结果，该实验使用所提出的波带片测量了凹面镜的形状误差。实验结果与用斐索干涉仪获得的结果吻合得很好。
