Department of Photonics, National Sun Yat-sen University, Kaohsiung, 804, Taiwan.
Opt Lett. 2010 Nov 1;35(21):3643-5. doi: 10.1364/OL.35.003643.
A method of direct measurement of near-field phase and intensity distribution of laser diodes employing a single-mode fiber interferometer is proposed and demonstrated. The phase and intensity of the output beam of the laser in the vicinity of the output facet are measured directly via interferometry. Using a 980 nm laser diode as an example, we obtained a beam width of 0.9 and 3.6 μm at the output facet in the vertical and horizontal axes, respectively. In addition, the phase information of the output beam was also obtained by using interferometry. This technique is particularly useful for laser diodes whose near-field phases are difficult to measure directly. The measured vertical and horizontal wavefront radius of curvatures of a laser diode are in good agreement with the calculation from Gaussian beam theory. Detailed understanding and measurement of the near-field phase and intensity distributions of light sources and optical components are essential for micro-optic designs with better mode matching to minimize the insertion loss.
提出并演示了一种利用单模光纤干涉仪直接测量激光二极管近场相位和强度分布的方法。通过干涉测量法直接测量激光在出射端面附近的出射光束的相位和强度。以 980nm 激光二极管为例,我们在垂直和水平方向上分别在出射端面处获得了 0.9μm 和 3.6μm 的光束宽度。此外,还通过干涉测量获得了出射光束的相位信息。对于近场相位难以直接测量的激光二极管,这种技术特别有用。激光二极管的垂直和水平波前曲率半径的测量值与高斯光束理论的计算值吻合较好。详细了解和测量光源和光学元件的近场相位和强度分布对于微光学设计至关重要,可以更好地实现模式匹配,以最小化插入损耗。