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用于测量规则光谱透过率的高精度光谱仪。

High-accuracy spectrometer for measurement of regular spectral transmittance.

作者信息

Manoochehri F, Ikonen E

出版信息

Appl Opt. 1995 Jul 1;34(19):3686-92. doi: 10.1364/AO.34.003686.

Abstract

A high-accuracy spectrometer has been developed for measuring regular spectral transmittance. The spectrometer is an automated, single-beam instrument that is based on a grating monochromator, reflecting optics, and an averaging sphere detector unit with a silicon photodiode. The uncertainties related to wavelength calibration, detector nonlinearity, system instability, beam displacement, polarization, stray light, interreflections, and beam uniformity are determined for the visible spectral range from 380 to 780 nm. A total uncertainty of 3 × 10(-4) (1σ) is estimated for transmittance measurements of homogeneous neutral-density filters. The uncertainty of the wavelength scale is 0.06 nm. As a specific application, calibration of V(λ)-correction filters is studied. To verify the accuracy of the transmittance measurements, a comparison of the measured and predicted transmittances of a sample of high-purity fused silica is made, revealing agreement at the 5 × 10(-4) level.

摘要

已开发出一种用于测量常规光谱透射率的高精度光谱仪。该光谱仪是一种基于光栅单色仪、反射光学器件以及带有硅光电二极管的积分球探测器单元的自动化单光束仪器。针对380至780纳米的可见光谱范围,确定了与波长校准、探测器非线性、系统不稳定性、光束位移、偏振、杂散光、相互反射以及光束均匀性相关的不确定度。对于均匀中性密度滤光片的透射率测量,估计总不确定度为3×10⁻⁴(1σ)。波长刻度的不确定度为0.06纳米。作为一个具体应用,研究了V(λ)校正滤光片的校准。为验证透射率测量的准确性,对高纯度熔融石英样品的测量透射率和预测透射率进行了比较,结果表明二者在5×10⁻⁴水平上相符。

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