Testorf M, Sinzinger S
Appl Opt. 1995 Oct 1;34(28):6431-7. doi: 10.1364/AO.34.006431.
Microlenses can be generated with various fabrication technologies. Some of these technologies cause large spherical aberrations in the resulting microlenses. We describe an algorithm based on Rayleigh's quarter-wave criterion, which allows the evaluation of lens parameters for those microlenses. Specifically, we investigate numerical aperture, focal length, and space-bandwidth product with respect to applications in optical microsystems. We apply our algorithm to different types of microlenses, three gradient-index lenses, and one surface-relief lens. The experimental results demonstrate that our algorithm provides a helpful characterization method for microlenses with large aberrations.
