Physikalisches Institut der Universität Würzburg (EP2), D-97074 Würzburg, Germany.
Phys Chem Chem Phys. 2011 Jan 14;13(2):498-505. doi: 10.1039/c0cp00758g. Epub 2010 Nov 8.
The detailed structural characterization of nanoparticles is a very important issue since it enables a precise understanding of their electronic, optical and magnetic properties. Here we introduce a new method for modeling the structure of very small particles by means of powder X-ray diffraction. Using thioglycerol-capped ZnO nanoparticles with a diameter of less than 3 nm as an example we demonstrate that our ensemble modeling method is superior to standard XRD methods like, e.g., Rietveld refinement. Besides fundamental properties (size, anisotropic shape and atomic structure) more sophisticated properties like imperfections in the lattice, a size distribution as well as strain and relaxation effects in the particles and-in particular-at their surface (surface relaxation effects) can be obtained. Ensemble properties, i.e., distributions of the particle size and other properties, can also be investigated which makes this method superior to imaging techniques like (high resolution) transmission electron microscopy or atomic force microscopy, in particular for very small nanoparticles. For the particles under study an excellent agreement of calculated and experimental X-ray diffraction patterns could be obtained with an ensemble of anisotropic polyhedral particles of three dominant sizes, wurtzite structure and a significant relaxation of Zn atoms close to the surface.
详细的纳米颗粒结构特征是一个非常重要的问题,因为它使我们能够精确地理解它们的电子、光学和磁学性质。在这里,我们引入了一种新的方法,通过粉末 X 射线衍射来模拟非常小颗粒的结构。我们以直径小于 3nm 的巯基甘油封端的 ZnO 纳米颗粒为例,证明了我们的集合建模方法优于标准的 X 射线衍射方法,如 Rietveld 精修。除了基本性质(尺寸、各向异性形状和原子结构)外,还可以获得更复杂的性质,如晶格中的不完整性、尺寸分布以及颗粒中的应变和弛豫效应,特别是在其表面(表面弛豫效应)。还可以研究集合性质,即颗粒尺寸和其他性质的分布,这使得该方法优于成像技术,如(高分辨率)透射电子显微镜或原子力显微镜,特别是对于非常小的纳米颗粒。对于所研究的颗粒,通过使用三个主要尺寸的各向异性多面体颗粒、纤锌矿结构和表面附近 Zn 原子的显著弛豫的集合,可以得到与实验 X 射线衍射图谱非常吻合的计算结果。