Tachikura M
Appl Opt. 1995 Dec 1;34(34):8056-7. doi: 10.1364/AO.34.008056.
This paper describes a convenient technique for measuring the loss of optical devices that have connectors at both ends. The technique can provide both bidirectional internal and values temporal connector loss by the mathematical solution of four normalized power measurements. Accuracy of the internal loss measurement is limited by the need to use four variables that may fluctuate due to unsuitable fiber manipulations or leaky modes.
本文描述了一种用于测量两端带有连接器的光学器件损耗的简便技术。该技术可通过对四个归一化功率测量值进行数学求解，得出双向内部损耗和时间连接器损耗值。内部损耗测量的精度受到使用四个可能因光纤操作不当或泄漏模式而波动的变量的限制。
