Materials Reliability Division, National Institute of Standards and Technology, Boulder, Colorado 80305, United States.
Anal Chem. 2010 Dec 15;82(24):9977-82. doi: 10.1021/ac102030z. Epub 2010 Nov 16.
A new method for analyzing the chemical purity and consistency of microscale samples with a quartz crystal microbalance (QCM) sensor platform is described. The QCM is used to monitor submicrogram changes in the mass of a deposited thin film as a function of temperature, in a manner similar to that of a conventional thermogravimetric analyzer (TGA). Results correlated well with TGA measurements for a wide range of representative materials, including organic compounds, ionic detergents, oxidizing and inert powders, carbon nanotubes, and various mixtures of these samples. In each case, the sample mass was on the order of a few micrograms, compared to the need for several milligrams for conventional TGA analysis. This work illustrates the effectiveness of this approach for analysis of nanoparticles, thin films, and highly purified specimens on the microgram scale.
一种利用石英晶体微天平（QCM）传感器平台分析微尺度样品化学纯度和一致性的新方法。QCM 用于监测沉积薄膜质量随温度的亚微变化，其方式类似于传统的热重分析仪（TGA）。结果与 TGA 对多种代表性材料（包括有机化合物、离子型洗涤剂、氧化性和惰性粉末、碳纳米管以及这些样品的各种混合物）的测量结果相关性良好。在每种情况下，与传统 TGA 分析所需的数毫克相比，样品质量都在几微克左右。这项工作说明了该方法在分析微克级的纳米粒子、薄膜和高纯度样品方面的有效性。
