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顶部介电介质对石墨烯场效应晶体管栅电容的影响:对迁移率测量和传感器应用的启示。

Effect of top dielectric medium on gate capacitance of graphene field effect transistors: implications in mobility measurements and sensor applications.

机构信息

Center for Bioelectronics and Biosensors, Biodesign Institute.

出版信息

Nano Lett. 2010 Dec 8;10(12):5060-4. doi: 10.1021/nl103306a. Epub 2010 Nov 19.

Abstract

We have carried out Hall measurement on back-gated graphene field effect transistors (FET) with and without a top dielectric medium. The gate efficiency increases by up to 2 orders of magnitude in the presence of a high κ top dielectric medium, but the mobility does not change significantly. Our measurement further shows that the back-gate capacitance is enhanced dramatically by the top dielectric medium, and the enhancement increases with the size of the top dielectric medium. Our work strongly suggests that the previously reported top dielectric medium-induced charge transport properties of graphene FETs are possibly due to the increase of gate capacitance, rather than enhancement of carrier mobility.

摘要

我们已经对带和不带顶部介电介质的背栅石墨烯场效应晶体管(FET)进行了 Hall 测量。在存在高介电常数顶部介电介质的情况下,栅极效率提高了两个数量级,但迁移率没有明显变化。我们的测量还进一步表明,顶部介电介质极大地增强了背栅电容,并且增强随着顶部介电介质的尺寸而增加。我们的工作强烈表明,先前报道的顶部介电介质诱导的石墨烯 FET 的电荷输运性质可能是由于栅极电容的增加,而不是载流子迁移率的增强。

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