Institute for Materials Research, University of Leeds, Leeds, UK.
Nanotoxicology. 2011 Jun;5(2):215-27. doi: 10.3109/17435390.2010.535622. Epub 2010 Nov 19.
The addition of a transmitted electron detector to a scanning electron microscope (SEM) allows the recording of bright and dark field scanning transmission electron microscope (STEM) images and the corresponding in-lens secondary electron images from the same region of a thin sample. These combined imaging techniques have been applied here to the analysis of ultrathin sections of cells exposed in vitro to nanomaterials for toxicology investigation. Electron microscopy in general permits the exact nature of the interaction of nanomaterials and cells to be elucidated, and in addition the use of STEM mode in the SEM enables the easy identification and exclusion of artefacts produced by ultramicrotome sectioning. The imaging and analysis obtained by using the STEM mode in the SEM configuration from three different nanomaterial systems of importance (iron oxide nanoparticles, single-walled carbon nanotubes and cadmium selenide quantum dots) indicate that it is a simple, practical and cost-effective tool for nanotoxicological research.
在扫描电子显微镜（SEM）中添加传输电子探测器，允许记录明场和暗场扫描透射电子显微镜（STEM）图像以及来自薄样品同一区域的相应透镜内二次电子图像。这些组合成像技术已应用于体外暴露于纳米材料的细胞的超薄切片的毒理学研究。电子显微镜通常可以阐明纳米材料与细胞相互作用的确切性质，此外，SEM 中 STEM 模式的使用可以轻松识别和排除由超薄切片机切片产生的伪影。使用 SEM 配置中的 STEM 模式从三个具有重要意义的纳米材料系统（氧化铁纳米粒子、单壁碳纳米管和硒化镉量子点）获得的成像和分析表明，它是一种用于纳米毒理学研究的简单、实用且具有成本效益的工具。
