Bogner A, Jouneau P-H, Thollet G, Basset D, Gauthier C
Groupe d'Etudes de Métallurgie Physique et de Physique des Matériaux, UMR CNRS 5510, INSA de Lyon, Bâtiment B. Pascal, 7 Avenue Jean Capelle, 69621 Villeurbanne Cedex, France.
Micron. 2007;38(4):390-401. doi: 10.1016/j.micron.2006.06.008. Epub 2006 Jul 17.
A recently developed imaging mode called "wet-STEM" and new developments in environmental scanning electron microscopy (ESEM) allows the observation of nano-objects suspended in a liquid phase, with a few manometers resolution and a good signal to noise ratio. The idea behind this technique is simply to perform STEM-in-SEM, that is SEM in transmission mode, in an environmental SEM. The purpose of the present contribution is to highlight the main advances that contributed to development of the wet-STEM technique. Although simple in principle, the wet-STEM imaging mode would have been limited before high brightness electron sources became available, and needed some progresses and improvements in ESEM. This new technique extends the scope of SEM as a high-resolution microscope, relatively cheap and widely available imaging tool, for a wider variety of samples.
一种最近开发的名为“湿式扫描透射电子显微镜(wet-STEM)”的成像模式以及环境扫描电子显微镜(ESEM)的新进展,使得能够观察悬浮在液相中的纳米物体,具有几纳米的分辨率和良好的信噪比。这项技术背后的理念很简单,就是在环境扫描电子显微镜中进行扫描透射电子显微镜(STEM)操作,也就是在透射模式下进行扫描电子显微镜(SEM)操作。本论文的目的是突出促成湿式扫描透射电子显微镜技术发展的主要进展。尽管原理简单,但在高亮度电子源出现之前,湿式扫描透射电子显微镜成像模式会受到限制,并且需要环境扫描电子显微镜取得一些进展和改进。这项新技术将扫描电子显微镜作为一种高分辨率显微镜、相对便宜且广泛可用的成像工具的应用范围扩展到了更多种类的样品上。