Key Laboratory of Microelectronics Devices & Integrated Technology, Institute of Microelectronics, Chinese Academy of Sciences, Beijing 100029, China.
Opt Lett. 2010 Dec 1;35(23):4048-50. doi: 10.1364/OL.35.004048.
Combining the advantages of photon sieves (PSs) and compound Fresnel zone plates (CZPs), we designed compound photon sieves (CPSs) for hard-x-ray nanofocusing. A CPS consists of an inner PS using the first-order diffraction surrounded by an outer zone plate using the third-order diffraction. A robust digital prolate spheroidal window was used as an apodization window for the inner PS, making CPSs more flexible than CZPs. CPSs can provide not only slightly better resolution compared to CZPs, but also it can significantly suppress the sidelobes, leading to a high signal-to-noise ratio. Further improvement of the high-aspect-ratio metal nanostructure process will allow CPSs to be a promising candidate for hard-x-ray nanofocusing in the high-energy region above 20 keV.
我们结合光子筛 (PSs) 和复合菲涅耳波带片 (CZPs) 的优点，设计了用于硬 X 射线纳米聚焦的复合光子筛 (CPSs)。CPS 由内 PS 和外 ZP 组成，内 PS 采用一阶衍射，外 ZP 采用三阶衍射。一个稳健的数字长椭球窗口被用作内 PS 的变迹窗口，这使得 CPSs 比 CZPs 更具灵活性。CPSs 不仅可以提供比 CZPs 略好的分辨率，还可以显著抑制旁瓣，从而获得高信噪比。进一步提高高纵横比金属纳米结构工艺水平，将使 CPSs 成为高能区 20keV 以上硬 X 射线纳米聚焦的有前途的候选方案。
