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Thickness-limited performance of CuInSe₂ nanocrystal photovoltaic devices.

作者信息

Akhavan Vahid A, Panthani Matthew G, Goodfellow Brian W, Reid Dariya K, Korgel Brian A

机构信息

Department of Chemical Engineering, The University of Texas at Austin, 78712-106, USA.

出版信息

Opt Express. 2010 Sep 13;18 Suppl 3:A411-20. doi: 10.1364/OE.18.00A411.

DOI:10.1364/OE.18.00A411
PMID:21165071
Abstract

This paper reports our latest results using colloidal CuInSe₂ nanocrystal inks to prepare photovoltaic (PV) devices. Thus far, devices with nanocrystal layers processed under ambient conditions with no post-deposition treatment have achieved power conversion efficiencies of up to 3.1%. Device efficiency is largely limited by charge carrier trapping in the nanocrystal layer, and the highest device efficiencies are obtained with very thin layers-less than 150 nm-absorbing only a fraction of the incident light. Devices with thicker nanocrystal layers had lower power conversion efficiency, despite the increased photon absorption, because the internal quantum efficiency of the devices decreased significantly. The thin, most efficient devices exhibited internal quantum efficiencies as high as 40%, across a wide spectrum. Mott-Schottky measurements revealed that the active region thickness in the devices is approximately 50 nm.

摘要

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