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带隙偏移驱动的 SiGe 核壳纳米线掺杂效率。

Band-offset driven efficiency of the doping of SiGe core-shell nanowires.

机构信息

Centro S3, CNR-Istituto di Nanoscienze, Modena, Italy.

出版信息

Nano Lett. 2011 Feb 9;11(2):594-8. doi: 10.1021/nl103621s. Epub 2010 Dec 28.

Abstract

Impurity doping of semiconducting nanowires has been predicted to become increasingly inefficient as the wire diameter is reduced, because impurity states get deeper due to quantum and dielectric confinement. We show that efficient n- and p-type doping can be achieved in SiGe core-shell nanowires as thin as 2 nm, taking advantage of the band offset at the Si/Ge interface. A one-dimensional electron (hole) gas is created at the band-edge and the carrier density is uniquely controlled by the impurity concentration with no need of thermal activation. Additionally, SiGe core-shell nanowires provide naturally the separation between the different types of carriers, electron and holes, and are ideally suited for photovoltaic applications.

摘要

杂质掺杂半导体纳米线已被预测随着直径的减小效率会越来越低,这是因为杂质态由于量子和介电限域而变得更深。我们展示了通过利用 Si/Ge 界面处的能带偏移,在厚度低至 2nm 的 SiGe 核壳纳米线中可以实现高效的 n 型和 p 型掺杂。在能带边缘处形成了一维电子(空穴)气体,载流子密度可以通过杂质浓度唯一控制,而无需热激活。此外,SiGe 核壳纳米线自然地将不同类型的载流子(电子和空穴)分离开来,非常适合用于光伏应用。

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