North Carolina State University, Raleigh, North Carolina 27695, USA.
J Chem Phys. 2011 Jan 14;134(2):024702. doi: 10.1063/1.3506636.
Near edge x-ray absorption fine structure (NEXAFS) spectroscopy has evolved into a powerful characterization tool for polymeric materials and is increasingly being used to elucidate composition and orientation in thin films of relevance to organic electronic devices. For accurate quantitative compositional analysis, insight into the electronic structure and the ability to assess molecular orientation, reliable reference spectra with known energy resolution and calibrated energy scale are required. We report a set of such NEXAFS spectra from 23 semiconducting polymers and some related materials that are frequently used in organic device research.
近边 X 射线吸收精细结构（NEXAFS）光谱已发展成为一种强大的高分子材料特性分析工具，并且越来越多地用于阐明与有机电子器件相关的薄膜中的组成和取向。对于准确的定量成分分析，需要深入了解电子结构和评估分子取向的能力，以及具有已知能量分辨率和校准能量标度的可靠参考光谱。我们报告了一组来自 23 种半导体聚合物和一些在有机器件研究中经常使用的相关材料的 NEXAFS 光谱。
