P. N. Lebedev Physics Institute, Academy of Sciences, Leninskii prospect 55, Moscow, Russia.
J Xray Sci Technol. 1993 Jan 1;4(1):37-43. doi: 10.3233/XST-1993-4104.
Destructive interference of waves scattered from both interfaces of a thin film deposited onto a rough substrate is theoretically shown to lead to considerable suppression (up to some orders) of x-ray scattering intensity. The conditions that are necessary for the suppression of scattering are discussed.
理论上表明，沉积在粗糙基底上的薄膜的两个界面处散射的波的相消干涉会导致 X 射线散射强度的显著抑制（高达几个数量级）。讨论了抑制散射所必需的条件。
