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扫描透射 X 射线显微镜作为一种探测胶体和光子晶体的新工具。

Scanning transmission x-ray microscopy as a novel tool to probe colloidal and photonic crystals.

机构信息

Inorganic Chemistry & Catalysis, Debye Institute for Nanomaterials Science, Utrecht University, Sorbonnelaan 16, 3584 CA Utrecht, The Netherlands.

出版信息

Small. 2011 Mar 21;7(6):804-11. doi: 10.1002/smll.201001745. Epub 2011 Feb 18.

DOI:10.1002/smll.201001745
PMID:21337510
Abstract

Photonic crystals consisting of nano- to micrometer-sized building blocks, such as multiple sorts of colloids, have recently received widespread attention. It remains a challenge, however, to adequately probe the internal crystal structure and the corresponding deformations that inhibit the proper functioning of such materials. It is shown that scanning transmission X-ray microscopy (STXM) can directly reveal the local structure, orientations, and even deformations in polystyrene and silica colloidal crystals with 30-nm spatial resolution. Moreover, STXM is capable of imaging a diverse range of crystals, including those that are dry and inverted, and provides novel insights complementary to information obtained by benchmark confocal fluorescence and scanning electron microscopy techniques.

摘要

由纳米到微米大小的构建块组成的光子晶体,如多种胶体,最近受到了广泛关注。然而,充分探测内部晶体结构和相应的变形,以抑制此类材料的正常功能,仍然是一个挑战。结果表明,扫描透射 X 射线显微镜(STXM)可以直接揭示具有 30nm 空间分辨率的聚苯乙烯和二氧化硅胶体晶体的局部结构、取向,甚至变形。此外,STXM 能够对各种晶体成像,包括干燥和倒置的晶体,并提供了与基准共聚焦荧光和扫描电子显微镜技术获得的信息互补的新见解。

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Scanning transmission x-ray microscopy as a novel tool to probe colloidal and photonic crystals.扫描透射 X 射线显微镜作为一种探测胶体和光子晶体的新工具。
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Nanoscale characterization of local structures and defects in photonic crystals using synchrotron-based transmission soft X-ray microscopy.
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Sci Rep. 2016 Apr 18;6:24488. doi: 10.1038/srep24488.