Chen Jun-Rong, Lu Tien-Chang, Wu Yung-Chi, Lin Shiang-Chi, Hsieh Wen-Feng, Wang Shing-Chung, Deng Hui
Department of Photonics, National Chiao Tung University, Hsinchu, Taiwan.
Opt Express. 2011 Feb 28;19(5):4101-12. doi: 10.1364/OE.19.004101.
Wide bandgap semiconductors are promising materials for the development of polariton-based optoelectronic devices operating at room temperature (RT). We report the characteristics of ZnO-based microcavities (MCs) in the strong coupling regime at RT with a vacuum Rabi splitting of 72 meV. The impact of scattering states of excitons on polariton dispersion is investigated. Only the lower polariton branches (LPBs) can be clearly observed in ZnO MCs since the large vacuum Rabi splitting pushes the upper polariton branches (UPBs) into the scattering absorption states in the ZnO bulk active region. In addition, we systematically investigate the polariton relaxation bottleneck in bulk ZnO-based MCs. Angle-resolved photoluminescence measurements are performed from 100 to 300 K for different cavity-exciton detunings. A clear polariton relaxation bottleneck is observed at low temperature and large negative cavity detuning conditions. The bottleneck is suppressed with increasing temperature and decreasing detuning, due to more efficient phonon-assisted relaxation and a longer radiative lifetime of the polaritons.
宽带隙半导体是用于开发在室温(RT)下工作的基于极化激元的光电器件的有前景的材料。我们报道了基于ZnO的微腔(MCs)在室温下强耦合 regime 中的特性,其真空拉比分裂为72 meV。研究了激子散射态对极化激元色散的影响。由于大的真空拉比分裂将上极化激元分支(UPBs)推到ZnO体有源区的散射吸收态中,因此在ZnO MCs中只能清楚地观察到下极化激元分支(LPBs)。此外,我们系统地研究了基于ZnO体的MCs中的极化激元弛豫瓶颈。针对不同的腔 - 激子失谐,在100至300 K范围内进行了角分辨光致发光测量。在低温和大的负腔失谐条件下观察到明显的极化激元弛豫瓶颈。由于更有效的声子辅助弛豫和极化激元更长的辐射寿命,随着温度升高和失谐减小,瓶颈受到抑制。