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自旋极化扫描隧道显微镜和光谱学研究铬在 Cr(001)表面上的情况。

Spin-polarized scanning tunneling microscopy and spectroscopy study of chromium on a Cr(001) surface.

机构信息

Laboratoire Matériaux et Phénomènes Quantiques, Université Paris Diderot et CNRS, UMR 7162, Case courrier 7021, 75205 Paris Cedex 13, France.

出版信息

J Phys Condens Matter. 2011 Feb 2;23(4):045007. doi: 10.1088/0953-8984/23/4/045007. Epub 2011 Jan 7.

DOI:10.1088/0953-8984/23/4/045007
PMID:21406881
Abstract

Several tens of chromium layers were deposited at 250 °C on a Cr(001) surface and investigated by spin-polarized scanning tunneling microscopy (SP-STM), Auger electron spectroscopy (AES) and scanning tunneling spectroscopy (STS). Chromium is found to grow with a mound-like morphology resulting from the stacking of several monolayers which do not uniformly cover the whole surface of the substrate. The terminal plane consists of an irregular array of Cr islands with lateral sizes smaller than 20 × 20 nm(2). Combined AES and STS measurements reveal the presence of a significant amount of segregants prior to and after deposition. A detailed investigation of the surface shows that it consists of two types of patches. Thanks to STS measurements, the two types of area have been identified as being either chromium pure or segregant rich. SP-STM experiments have evidenced that the antiferromagnetic layer coupling remains in the chromium mounds after deposition and is not significantly affected by the presence of the segregants.

摘要

数十层铬在 250°C 下沉积在 Cr(001) 表面上,并通过自旋极化扫描隧道显微镜 (SP-STM)、俄歇电子能谱 (AES) 和扫描隧道谱 (STS) 进行了研究。发现铬以堆积的多层形貌生长,这些多层并不均匀地覆盖基底的整个表面。终端平面由 Cr 岛的不规则阵列组成,其横向尺寸小于 20×20nm(2)。结合 AES 和 STS 测量表明,在沉积前后存在大量的偏析物。对表面的详细研究表明,它由两种类型的斑块组成。得益于 STS 测量,这两种类型的区域已被确定为要么是纯铬,要么是富含偏析物。SP-STM 实验表明,在沉积后,反铁磁层耦合仍然存在于铬丘中,并且不受偏析物的存在的显著影响。

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