Zhou Yanbiao, He Bin, Yang Yang, Wang Fang, Liu Weimin, Wang Pengfei, Zhang Wenjun, Bello Igor, Lee Shuit-Tong
Key Laboratory of Photochemical Conversion and Optoelectronic Materials, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing 100190, People's Republic of China.
J Nanosci Nanotechnol. 2011 Mar;11(3):2292-7. doi: 10.1166/jnn.2011.3559.
We present a simple approach for preparing hydrophobic silicon surfaces by constructing silicon nanowire arrays using Ag-assisted chemical etching without low-surface-energy material modification. The static and dynamic wetting properties of the nanostructured surfaces and their dependence on etching conditions were studied. It was revealed that the surface topologies of silicon nanowire arrays and their corresponding wetting properties could be tuned by varying the etching time. Under optimized etching conditions, superhydrophobic surfaces with an apparent contact angle larger than 150 degrees and a sliding angle smaller than 10 degrees were achieved due to the formation of a hierarchical structure. The origin of hydrophobic behavior was discussed based on Wenzel and Cassie models. In addition, the effects of surface modification of Si surface nanostructures on their hydrophobic characteristics were also investigated.
我们提出了一种简单的方法,通过银辅助化学蚀刻构建硅纳米线阵列来制备疏水性硅表面,而无需进行低表面能材料改性。研究了纳米结构表面的静态和动态润湿特性及其对蚀刻条件的依赖性。结果表明,通过改变蚀刻时间可以调节硅纳米线阵列的表面拓扑结构及其相应的润湿特性。在优化的蚀刻条件下,由于形成了分级结构,获得了表观接触角大于150度且滑动角小于10度的超疏水表面。基于文泽尔模型和卡西模型讨论了疏水行为的起源。此外,还研究了硅表面纳米结构的表面改性对其疏水特性的影响。