Santoro Gonzalo, Yousef Ibraheem, Jamme Frederic, Dumas Paul, Ellis Gary
Instituto de Ciencia y Tecnología de Polímeros, CSIC, c∕ Juan de la Cierva 3, E-28006 Madrid, Spain.
Rev Sci Instrum. 2011 Mar;82(3):033710. doi: 10.1063/1.3562900.
Over the last decade the use of synchrotron infrared microspectroscopy to spatially discriminate chemical and structural features in many different types of materials has grown considerably and has made significant impact in numerous research areas, in particular, in biological sciences and medicine. Although the brightness advantage of the synchrotron infrared (IR) source is well accepted as the key to high spatial discrimination, little attention has been given to measure the polarization properties of the synchrotron light at the sample stage in IR microscopy. In this work the intrinsic polarization of the IR source and its consequences for the study of anisotropic materials are discussed. The polarization characteristics of predominantly bending magnet radiation and predominantly edge radiation sources were measured at the microscope focus and compared. To illustrate the direct use of the intrinsic polarization of these sources in microscopy, the orientation and conformational details of a drawn polymer sample are considered.
在过去十年中,同步辐射红外显微技术用于在空间上区分多种不同类型材料的化学和结构特征,其应用有了显著增长,并在众多研究领域,特别是生物科学和医学领域产生了重大影响。尽管同步辐射红外(IR)光源的亮度优势被公认为实现高空间分辨率的关键,但在红外显微镜的样品阶段,对于测量同步辐射光的偏振特性却很少有人关注。在这项工作中,我们讨论了红外光源的固有偏振及其对各向异性材料研究的影响。我们测量并比较了主要为弯曲磁铁辐射源和主要为边缘辐射源在显微镜焦点处的偏振特性。为了说明这些光源的固有偏振在显微镜中的直接应用,我们考虑了拉伸聚合物样品的取向和构象细节。